Requirements for Practical IDDQ Testing of Deep Submicron Circuits
نویسنده
چکیده
This paper describes the requirements that quiescent current (IDDQ) testing must meet in order to continue being useful in the face of rising background currents. Using projections from the 1999 International Technology Roadmap for Semiconductors, several different techniques are evaluated to determine their usefulness in future technologies.
منابع مشابه
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تاریخ انتشار 2000